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Diffstat (limited to 'include/linux/mtd/nand_new.h')
| -rw-r--r-- | include/linux/mtd/nand_new.h | 469 |
1 files changed, 469 insertions, 0 deletions
diff --git a/include/linux/mtd/nand_new.h b/include/linux/mtd/nand_new.h new file mode 100644 index 000000000..7d4b805b9 --- /dev/null +++ b/include/linux/mtd/nand_new.h @@ -0,0 +1,469 @@ +/* + * linux/include/linux/mtd/nand.h + * + * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com> + * Steven J. Hill <sjhill@realitydiluted.com> + * Thomas Gleixner <tglx@linutronix.de> + * + * $Id: nand.h,v 1.68 2004/11/12 10:40:37 gleixner Exp $ + * + * This program is free software; you can redistribute it and/or modify + * it under the terms of the GNU General Public License version 2 as + * published by the Free Software Foundation. + * + * Info: + * Contains standard defines and IDs for NAND flash devices + * + * Changelog: + * 01-31-2000 DMW Created + * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers + * so it can be used by other NAND flash device + * drivers. I also changed the copyright since none + * of the original contents of this file are specific + * to DoC devices. David can whack me with a baseball + * bat later if I did something naughty. + * 10-11-2000 SJH Added private NAND flash structure for driver + * 10-24-2000 SJH Added prototype for 'nand_scan' function + * 10-29-2001 TG changed nand_chip structure to support + * hardwarespecific function for accessing control lines + * 02-21-2002 TG added support for different read/write adress and + * ready/busy line access function + * 02-26-2002 TG added chip_delay to nand_chip structure to optimize + * command delay times for different chips + * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate + * defines in jffs2/wbuf.c + * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if + * CONFIG_MTD_NAND_ECC_JFFS2 is not set + * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC + * + * 08-29-2002 tglx nand_chip structure: data_poi for selecting + * internal / fs-driver buffer + * support for 6byte/512byte hardware ECC + * read_ecc, write_ecc extended for different oob-layout + * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB, + * NAND_YAFFS_OOB + * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL + * Split manufacturer and device ID structures + * + * 02-08-2004 tglx added option field to nand structure for chip anomalities + * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id + * update of nand_chip structure description + */ +#ifndef __LINUX_MTD_NAND_NEW_H +#define __LINUX_MTD_NAND_NEW_H + +#include <linux/mtd/compat.h> +#include <linux/mtd/mtd.h> + +struct mtd_info; +/* Scan and identify a NAND device */ +extern int nand_scan (struct mtd_info *mtd, int max_chips); +/* Free resources held by the NAND device */ +extern void nand_release (struct mtd_info *mtd); + +/* Read raw data from the device without ECC */ +extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen); + + + +/* This constant declares the max. oobsize / page, which + * is supported now. If you add a chip with bigger oobsize/page + * adjust this accordingly. + */ +#define NAND_MAX_OOBSIZE 64 + +/* + * Constants for hardware specific CLE/ALE/NCE function +*/ +/* Select the chip by setting nCE to low */ +#define NAND_CTL_SETNCE 1 +/* Deselect the chip by setting nCE to high */ +#define NAND_CTL_CLRNCE 2 +/* Select the command latch by setting CLE to high */ +#define NAND_CTL_SETCLE 3 +/* Deselect the command latch by setting CLE to low */ +#define NAND_CTL_CLRCLE 4 +/* Select the address latch by setting ALE to high */ +#define NAND_CTL_SETALE 5 +/* Deselect the address latch by setting ALE to low */ +#define NAND_CTL_CLRALE 6 +/* Set write protection by setting WP to high. Not used! */ +#define NAND_CTL_SETWP 7 +/* Clear write protection by setting WP to low. Not used! */ +#define NAND_CTL_CLRWP 8 + +/* + * Standard NAND flash commands + */ +#define NAND_CMD_READ0 0 +#define NAND_CMD_READ1 1 +#define NAND_CMD_PAGEPROG 0x10 +#define NAND_CMD_READOOB 0x50 +#define NAND_CMD_ERASE1 0x60 +#define NAND_CMD_STATUS 0x70 +#define NAND_CMD_STATUS_MULTI 0x71 +#define NAND_CMD_SEQIN 0x80 +#define NAND_CMD_READID 0x90 +#define NAND_CMD_ERASE2 0xd0 +#define NAND_CMD_RESET 0xff + +/* Extended commands for large page devices */ +#define NAND_CMD_READSTART 0x30 +#define NAND_CMD_CACHEDPROG 0x15 + +/* Status bits */ +#define NAND_STATUS_FAIL 0x01 +#define NAND_STATUS_FAIL_N1 0x02 +#define NAND_STATUS_TRUE_READY 0x20 +#define NAND_STATUS_READY 0x40 +#define NAND_STATUS_WP 0x80 + +/* + * Constants for ECC_MODES + */ + +/* No ECC. Usage is not recommended ! */ +#define NAND_ECC_NONE 0 +/* Software ECC 3 byte ECC per 256 Byte data */ +#define NAND_ECC_SOFT 1 +/* Hardware ECC 3 byte ECC per 256 Byte data */ +#define NAND_ECC_HW3_256 2 +/* Hardware ECC 3 byte ECC per 512 Byte data */ +#define NAND_ECC_HW3_512 3 +/* Hardware ECC 3 byte ECC per 512 Byte data */ +#define NAND_ECC_HW6_512 4 +/* Hardware ECC 8 byte ECC per 512 Byte data */ +#define NAND_ECC_HW8_512 6 +/* Hardware ECC 12 byte ECC per 2048 Byte data */ +#define NAND_ECC_HW12_2048 7 + +/* + * Constants for Hardware ECC +*/ +/* Reset Hardware ECC for read */ +#define NAND_ECC_READ 0 +/* Reset Hardware ECC for write */ +#define NAND_ECC_WRITE 1 +/* Enable Hardware ECC before syndrom is read back from flash */ +#define NAND_ECC_READSYN 2 + +/* Option constants for bizarre disfunctionality and real +* features +*/ +/* Chip can not auto increment pages */ +#define NAND_NO_AUTOINCR 0x00000001 +/* Buswitdh is 16 bit */ +#define NAND_BUSWIDTH_16 0x00000002 +/* Device supports partial programming without padding */ +#define NAND_NO_PADDING 0x00000004 +/* Chip has cache program function */ +#define NAND_CACHEPRG 0x00000008 +/* Chip has copy back function */ +#define NAND_COPYBACK 0x00000010 +/* AND Chip which has 4 banks and a confusing page / block + * assignment. See Renesas datasheet for further information */ +#define NAND_IS_AND 0x00000020 +/* Chip has a array of 4 pages which can be read without + * additional ready /busy waits */ +#define NAND_4PAGE_ARRAY 0x00000040 + +/* Options valid for Samsung large page devices */ +#define NAND_SAMSUNG_LP_OPTIONS \ + (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK) + +/* Macros to identify the above */ +#define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR)) +#define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING)) +#define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG)) +#define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK)) + +/* Mask to zero out the chip options, which come from the id table */ +#define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR) + +/* Non chip related options */ +/* Use a flash based bad block table. This option is passed to the + * default bad block table function. */ +#define NAND_USE_FLASH_BBT 0x00010000 +/* The hw ecc generator provides a syndrome instead a ecc value on read + * This can only work if we have the ecc bytes directly behind the + * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */ +#define NAND_HWECC_SYNDROME 0x00020000 + + +/* Options set by nand scan */ +/* Nand scan has allocated oob_buf */ +#define NAND_OOBBUF_ALLOC 0x40000000 +/* Nand scan has allocated data_buf */ +#define NAND_DATABUF_ALLOC 0x80000000 + + +/* + * nand_state_t - chip states + * Enumeration for NAND flash chip state + */ +typedef enum { + FL_READY, + FL_READING, + FL_WRITING, + FL_ERASING, + FL_SYNCING, + FL_CACHEDPRG, +} nand_state_t; + +/* Keep gcc happy */ +struct nand_chip; + +#if 0 +/** + * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices + * @lock: protection lock + * @active: the mtd device which holds the controller currently + */ +struct nand_hw_control { + spinlock_t lock; + struct nand_chip *active; +}; +#endif + +/** + * struct nand_chip - NAND Private Flash Chip Data + * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device + * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device + * @read_byte: [REPLACEABLE] read one byte from the chip + * @write_byte: [REPLACEABLE] write one byte to the chip + * @read_word: [REPLACEABLE] read one word from the chip + * @write_word: [REPLACEABLE] write one word to the chip + * @write_buf: [REPLACEABLE] write data from the buffer to the chip + * @read_buf: [REPLACEABLE] read data from the chip into the buffer + * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data + * @select_chip: [REPLACEABLE] select chip nr + * @block_bad: [REPLACEABLE] check, if the block is bad + * @block_markbad: [REPLACEABLE] mark the block bad + * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines + * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line + * If set to NULL no access to ready/busy is available and the ready/busy information + * is read from the chip status register + * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip + * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready + * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware + * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw) + * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only + * be provided if a hardware ECC is available + * @erase_cmd: [INTERN] erase command write function, selectable due to AND support + * @scan_bbt: [REPLACEABLE] function to scan bad block table + * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines + * @eccsize: [INTERN] databytes used per ecc-calculation + * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step + * @eccsteps: [INTERN] number of ecc calculation steps per page + * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR) + * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip + * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress + * @state: [INTERN] the current state of the NAND device + * @page_shift: [INTERN] number of address bits in a page (column address bits) + * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock + * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry + * @chip_shift: [INTERN] number of address bits in one chip + * @data_buf: [INTERN] internal buffer for one page + oob + * @oob_buf: [INTERN] oob buffer for one eraseblock + * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized + * @data_poi: [INTERN] pointer to a data buffer + * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about + * special functionality. See the defines for further explanation + * @badblockpos: [INTERN] position of the bad block marker in the oob area + * @numchips: [INTERN] number of physical chips + * @chipsize: [INTERN] the size of one chip for multichip arrays + * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1 + * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf + * @autooob: [REPLACEABLE] the default (auto)placement scheme + * @bbt: [INTERN] bad block table pointer + * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup + * @bbt_md: [REPLACEABLE] bad block table mirror descriptor + * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan + * @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices + * @priv: [OPTIONAL] pointer to private chip date + */ + +struct nand_chip { + void __iomem *IO_ADDR_R; + void __iomem *IO_ADDR_W; + + u_char (*read_byte)(struct mtd_info *mtd); + void (*write_byte)(struct mtd_info *mtd, u_char byte); + u16 (*read_word)(struct mtd_info *mtd); + void (*write_word)(struct mtd_info *mtd, u16 word); + + void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len); + void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len); + int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len); + void (*select_chip)(struct mtd_info *mtd, int chip); + int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip); + int (*block_markbad)(struct mtd_info *mtd, loff_t ofs); + void (*hwcontrol)(struct mtd_info *mtd, int cmd); + int (*dev_ready)(struct mtd_info *mtd); + void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr); + int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state); + int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code); + int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc); + void (*enable_hwecc)(struct mtd_info *mtd, int mode); + void (*erase_cmd)(struct mtd_info *mtd, int page); + int (*scan_bbt)(struct mtd_info *mtd); + int eccmode; + int eccsize; + int eccbytes; + int eccsteps; + int chip_delay; +#if 0 + spinlock_t chip_lock; + wait_queue_head_t wq; + nand_state_t state; +#endif + int page_shift; + int phys_erase_shift; + int bbt_erase_shift; + int chip_shift; + u_char *data_buf; + u_char *oob_buf; + int oobdirty; + u_char *data_poi; + unsigned int options; + int badblockpos; + int numchips; + unsigned long chipsize; + int pagemask; + int pagebuf; + struct nand_oobinfo *autooob; + uint8_t *bbt; + struct nand_bbt_descr *bbt_td; + struct nand_bbt_descr *bbt_md; + struct nand_bbt_descr *badblock_pattern; + struct nand_hw_control *controller; + void *priv; +}; + +/* + * NAND Flash Manufacturer ID Codes + */ +#define NAND_MFR_TOSHIBA 0x98 +#define NAND_MFR_SAMSUNG 0xec +#define NAND_MFR_FUJITSU 0x04 +#define NAND_MFR_NATIONAL 0x8f +#define NAND_MFR_RENESAS 0x07 +#define NAND_MFR_STMICRO 0x20 + +/** + * struct nand_flash_dev - NAND Flash Device ID Structure + * + * @name: Identify the device type + * @id: device ID code + * @pagesize: Pagesize in bytes. Either 256 or 512 or 0 + * If the pagesize is 0, then the real pagesize + * and the eraseize are determined from the + * extended id bytes in the chip + * @erasesize: Size of an erase block in the flash device. + * @chipsize: Total chipsize in Mega Bytes + * @options: Bitfield to store chip relevant options + */ +struct nand_flash_dev { + char *name; + int id; + unsigned long pagesize; + unsigned long chipsize; + unsigned long erasesize; + unsigned long options; +}; + +/** + * struct nand_manufacturers - NAND Flash Manufacturer ID Structure + * @name: Manufacturer name + * @id: manufacturer ID code of device. +*/ +struct nand_manufacturers { + int id; + char * name; +}; + +extern struct nand_flash_dev nand_flash_ids[]; +extern struct nand_manufacturers nand_manuf_ids[]; + +/** + * struct nand_bbt_descr - bad block table descriptor + * @options: options for this descriptor + * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE + * when bbt is searched, then we store the found bbts pages here. + * Its an array and supports up to 8 chips now + * @offs: offset of the pattern in the oob area of the page + * @veroffs: offset of the bbt version counter in the oob are of the page + * @version: version read from the bbt page during scan + * @len: length of the pattern, if 0 no pattern check is performed + * @maxblocks: maximum number of blocks to search for a bbt. This number of + * blocks is reserved at the end of the device where the tables are + * written. + * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than + * bad) block in the stored bbt + * @pattern: pattern to identify bad block table or factory marked good / + * bad blocks, can be NULL, if len = 0 + * + * Descriptor for the bad block table marker and the descriptor for the + * pattern which identifies good and bad blocks. The assumption is made + * that the pattern and the version count are always located in the oob area + * of the first block. + */ +struct nand_bbt_descr { + int options; + int pages[NAND_MAX_CHIPS]; + int offs; + int veroffs; + uint8_t version[NAND_MAX_CHIPS]; + int len; + int maxblocks; + int reserved_block_code; + uint8_t *pattern; +}; + +/* Options for the bad block table descriptors */ + +/* The number of bits used per block in the bbt on the device */ +#define NAND_BBT_NRBITS_MSK 0x0000000F +#define NAND_BBT_1BIT 0x00000001 +#define NAND_BBT_2BIT 0x00000002 +#define NAND_BBT_4BIT 0x00000004 +#define NAND_BBT_8BIT 0x00000008 +/* The bad block table is in the last good block of the device */ +#define NAND_BBT_LASTBLOCK 0x00000010 +/* The bbt is at the given page, else we must scan for the bbt */ +#define NAND_BBT_ABSPAGE 0x00000020 +/* The bbt is at the given page, else we must scan for the bbt */ +#define NAND_BBT_SEARCH 0x00000040 +/* bbt is stored per chip on multichip devices */ +#define NAND_BBT_PERCHIP 0x00000080 +/* bbt has a version counter at offset veroffs */ +#define NAND_BBT_VERSION 0x00000100 +/* Create a bbt if none axists */ +#define NAND_BBT_CREATE 0x00000200 +/* Search good / bad pattern through all pages of a block */ +#define NAND_BBT_SCANALLPAGES 0x00000400 +/* Scan block empty during good / bad block scan */ +#define NAND_BBT_SCANEMPTY 0x00000800 +/* Write bbt if neccecary */ +#define NAND_BBT_WRITE 0x00001000 +/* Read and write back block contents when writing bbt */ +#define NAND_BBT_SAVECONTENT 0x00002000 +/* Search good / bad pattern on the first and the second page */ +#define NAND_BBT_SCAN2NDPAGE 0x00004000 + +/* The maximum number of blocks to scan for a bbt */ +#define NAND_BBT_SCAN_MAXBLOCKS 4 + +extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd); +extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs); +extern int nand_default_bbt (struct mtd_info *mtd); +extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt); +extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt); + +/* +* Constants for oob configuration +*/ +#define NAND_SMALL_BADBLOCK_POS 5 +#define NAND_LARGE_BADBLOCK_POS 0 + +#endif /* __LINUX_MTD_NAND_NEW_H */ |